> Level: Undergraduate
> Prerequisites: Basic Circuit Theory (MYY203)
> Course Description: Basic circuit theory. Amplifiers - Operational
amplifiers. Pure semiconductors and doped semiconductors. The p-n junction -
Diodes. Diode circuits (rectifier and limiter circuits). Bipolar junction
transistors and field effect transistors: a) physical structure and operation,
b) current-voltage characteristics, c) DC operation, d) small-signal equivalent
circuit models. Single-stage transistor amplifiers, biasing and operation.
Differential amplifiers. Multi-stage amplifiers. Frequency response.
> Lab: Circuit design-simulation-implementation-measurement. Operational
amplifiers, Diode rectifier and limiter circuits, BJT amplifier, MOS amplifier,
Differential amplifier.
> Level: Undergraduate
> Prerequisites: Electronics (MYY404) & Digital Design I (MYY305)
> Course Description:
MOStransistor theory. CMOS technology and integrated circuit fabrication. CMOS
combinational circuit design, complex gates and logic families (static,
dynamic, Domino, CVSL, pass transistor logic). Sequential circuits. Circuit
characterization and performance estimation. Logical effort. Interconnect,
clocking strategies and power consumption. Clock and power distribution
techniques. Subsystems design (adders, counters, multipliers, memories, data
paths). Memory organization. FPGAs. VLSI testing and design for testability techniques.
> Lab: MOS transistor, CMOS circuit design.
> Level: Graduate
> Topic: Advanced Computer Systems
> Section: Hardware Systems
> Prerequisites: Digital Design I -II, VLSI Circuits
> Course Description: With the continuous scaling of transistor feature size, the chip complexity is dramatically increased since billions of transistors are integrated in a single chip (see the case of Systems-on-Chip – SoCs). Aiming to provide high quality integrated circuits and systems, these must be reliable and fully tested after production. In addition, during their whole operational life time in the field, we must ensure their reliable and uninterruptable operation. Consequently, design for reliability is an integral part of integrated circuits and systems design and manufacturing. This course covers the fields of integrated circuits and systems testing, design for testability and design for reliability. The topics discussed are: Importance of testing, Defects and fault models, Wear out and aging mechanisms, PVT variations, Test process, Advanced design for testability techniques, Advanced design for reliability techniques, Self-healing systems.